Material Analysis
Methods used to reveal morphology, structure, chemistry, composition, spectra, and molecular signatures.
Material Analysis
Microscopy & Imaging
3D Optical Scanning (3D Scan)Characterise full-field surface geometry, nominal-to-actual deviation, and dimensions, warpage, and local defects using a scope…→AFM-Infrared Spectroscopy (AFM-IR)Characterise nanoscale chemical identity, topography and local mechanical response, and chemical-domain size and distribution using a…→Atomic Force Microscopy (AFM)Characterise surface topography and roughness, local mechanical, electrical, or capacitance contrast, and feature height, width, and…→Computed Tomography (Industrial / Micro-Nano / In-situ / Synchrotron CT)Characterise internal geometry and density contrast, pores, cracks, inclusions, interfaces, and connectivity, and three-dimensional…→Confocal Laser Scanning Microscopy (CLSM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Correlative SEM-Raman AnalysisCharacterise morphology and microstructure, molecular or crystalline Raman identity, and elemental or molecular-ion distribution…→Correlative SEM-Raman-FIB-TOF-SIMSCharacterise morphology and microstructure, molecular or crystalline Raman identity, and elemental or molecular-ion distribution…→Cryogenic Scanning Electron Microscopy (Cryo-SEM)Characterise frozen-state morphology and ultrastructure, interfaces, pores, particles, and fracture faces, and optional elemental or…→Cryogenic TEM with Cryo-FIB Preparation (Cryo-TEM)Characterise frozen-state morphology and ultrastructure, interfaces, pores, particles, and fracture faces, and optional elemental or…→Electron Backscatter Diffraction (EBSD)Characterise crystal orientation and texture, grain size and boundary character, and phase distribution and local misorientation…→Electron Channelling Contrast Imaging (ECCI)Characterise dislocation structures and density trends, grain and sub-grain contrast, and near-surface deformation and defects using…→Extended-Depth-of-Field 3D Microscopy (3D-EDF)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Fluorescence Microscopy (FM)Characterise fluorescence intensity and spatial distribution, co-localisation, feature size, and area fraction, and time-,…→Focused Ion Beam SEM and Cross-Section Analysis (FIB-SEM)Characterise buried interfaces and layer thickness, site-specific defects, pores, and microstructure, and three-dimensional or…→High-Speed Imaging (HSI)Characterise position, velocity, and acceleration, event timing and deformation sequence, and crack, impact, spray, flow, or…→Infrared Thermal Imaging (IRT)Characterise surface temperature distribution, heating and cooling rates, and hot spots, thermal gradients, and transient response…→Laser Scanning Microscopy (LSM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Lorentz Transmission Electron Microscopy (Lorentz TEM)Characterise crystal structure, defects, and interfaces, particle size and lattice spacing, and nanoscale elemental or chemical…→Micro-LED Wafer AOI InspectionCharacterise defect location and class, feature dimensions and placement, and wafer-level yield and spatial defect distribution using…→Mineral Liberation Analysis (MLA)Characterise mineral abundance, liberation and locking, and grain size, association, and particle composition using a scope agreed…→Optical / Metallographic Microscopy (OM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Polarised Light Microscopy / Petrography (PLM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Scanning Capacitance Microscopy (SCM)Characterise surface topography and roughness, local mechanical, electrical, or capacitance contrast, and feature height, width, and…→Scanning Electrochemical Microscopy (SECM)Characterise local redox activity, reaction-rate and transport contrast, and electrochemical heterogeneity across a surface using a…→Scanning Electron Microscopy (SEM / FESEM / ESEM / In-situ)Characterise surface morphology and feature size, topographic and compositional contrast, and local defects, particles, coatings,…→Scanning Tunneling Microscopy (STM)Characterise surface topography and roughness, local mechanical, electrical, or capacitance contrast, and feature height, width, and…→Stereo Microscopy (Stereo OM)Characterise microstructure, texture, colour, and feature geometry, surface height or optical section position, and grain, phase,…→Terahertz 3D Tomographic Imaging (THz Tomography)Characterise internal geometry and density contrast, pores, cracks, inclusions, interfaces, and connectivity, and three-dimensional…→Transmission / Scanning Transmission Electron Microscopy (TEM/STEM)Characterise crystal structure, defects, and interfaces, particle size and lattice spacing, and nanoscale elemental or chemical…→White-Light Interferometric 3D Profilometry (WLI)Characterise surface topography, step height and form, and areal roughness and volume parameters using a scope agreed around your…→
Material Analysis
Structure & Spectroscopy
3D / Microcrystal Electron Diffraction (3D-ED/MicroED)Characterise unit cell and phase identity, crystal orientation and reciprocal lattice, and three-dimensional molecular or atomic…→Dislocation Density MeasurementCharacterise dislocation density or relative defect content, microstrain and coherent domain size, and spatial distribution of…→Neutron DiffractionCharacterise crystal and magnetic structure, light-element positions and site occupancy, and bulk phase, strain, or texture using a…→Positron Annihilation Lifetime Spectroscopy (PALS)Characterise positron lifetime components, vacancy-type defect or free-volume signatures, and relative defect concentration and depth…→Single-Crystal Orientation Analysis (Laue)Characterise crystal orientation and zone axis, miscut angle, and orientation spread or texture using a scope agreed around your…→Small-/Wide-Angle X-ray Scattering (SAXS/WAXS/GISAXS/GIWAXS)Characterise particle, pore, or domain size, shape, spacing, and orientation, and hierarchical order from SAXS through WAXS using a…→Three-Dimensional Atom Probe Tomography (3D-APT)Characterise 3D elemental and isotopic distribution, segregation, clustering, and interface chemistry, and nanoscale composition with…→X-ray Diffraction (Powder / Single-Crystal / Texture / In-situ / Synchrotron) (XRD)Characterise phase identity and fraction, lattice parameters, crystallite size, and microstrain, and texture, orientation, stress, or…→X-ray Reflectivity (XRR)Characterise film and multilayer thickness, electron density or mass-density contrast, and surface and interface roughness using a…→Cathodoluminescence Spectroscopy (CL)Characterise emission spectrum and intensity, defect or dopant-related luminescence, and spatial variation in growth, phase, or…→Circular Dichroism Spectroscopy (CD)Characterise CD or CPL spectrum, ellipticity or luminescence dissymmetry factor, and secondary-structure or chiral-state changes…→Circularly Polarised Luminescence Spectroscopy (CPL)Characterise CD or CPL spectrum, ellipticity or luminescence dissymmetry factor, and secondary-structure or chiral-state changes…→Electroluminescence / Electrochemiluminescence Spectroscopy (EL/ECL)Characterise emission spectrum and intensity, external quantum efficiency or luminance where configured, and spatial uniformity,…→Electron Paramagnetic / Spin Resonance Spectroscopy (EPR/ESR)Characterise g-values and hyperfine structure, radical, defect, or transition-metal identity, and spin concentration and relaxation…→Fourier Transform Infrared Spectroscopy (FTIR)Characterise functional groups and molecular vibrations, chemical identity and relative changes, and Bronsted and Lewis acid-site…→Hyperspectral Imaging (HSI)Characterise reflectance, transmittance, emission, or loss versus wavelength, spectral classes and spatial distribution, and…→Laser-Induced Breakdown Spectroscopy (LIBS)Characterise elemental fingerprint, local or depth-resolved composition, and rapid sorting or mapping across a surface using a scope…→Low-Field NMR and Magnetic Resonance Imaging (LF-NMR/MRI)Characterise T1 and T2 relaxation, mobile and bound fluid fractions, and pore, moisture, or spatial MRI contrast using a scope agreed…→Mössbauer SpectroscopyCharacterise isomer shift and quadrupole splitting, magnetic hyperfine field, and relative fraction of distinguishable resonant…→Optical Photothermal Infrared Spectroscopy (O-PTIR)Characterise nanoscale chemical identity, topography and local mechanical response, and chemical-domain size and distribution using a…→Optical-Fibre Spectral TestingCharacterise reflectance, transmittance, emission, or loss versus wavelength, spectral classes and spatial distribution, and…→Photoluminescence and Steady-State/Time-Resolved Fluorescence Spectroscopy (PL/TRPL/EEM)Characterise emission or transient spectrum, excited-state lifetime and kinetics, and quantum yield, energy transfer, trapping, or…→Pyridine-Adsorbed FTIR Spectroscopy (Py-IR)Characterise functional groups and molecular vibrations, chemical identity and relative changes, and Bronsted and Lewis acid-site…→Raman Spectroscopy (Polarised / Mapping / Confocal / In-situ)Characterise vibrational bands and material identity, phase, crystallinity, stress, or disorder, and spatial chemical distribution…→Solid-State Nuclear Magnetic Resonance Spectroscopy (SSNMR)Characterise chemical shifts and coupling, molecular connectivity, local structure, and dynamics, and purity, composition, or…→Solution-State Nuclear Magnetic Resonance Spectroscopy (NMR)Characterise chemical shifts and coupling, molecular connectivity, local structure, and dynamics, and purity, composition, or…→Sum Frequency Generation Vibrational Spectroscopy (SFG)Characterise interface-specific vibrational spectrum, molecular orientation and ordering, and changes during adsorption, reaction, or…→Terahertz Time-Domain Spectroscopy (THz-TDS)Characterise terahertz absorption and refractive index, complex permittivity and conductivity, and layer thickness, defects, or…→Thermoluminescence / Optically Stimulated Luminescence Spectroscopy (TL/OSL)Characterise glow or stimulation curve, integrated luminescence dose response, and trap depth and kinetic parameters where modelled…→Time-Resolved Emission Spectroscopy (TRES)Characterise emission or transient spectrum, excited-state lifetime and kinetics, and quantum yield, energy transfer, trapping, or…→Transient Absorption Spectroscopy (TAS)Characterise emission or transient spectrum, excited-state lifetime and kinetics, and quantum yield, energy transfer, trapping, or…→UV-Vis-NIR SpectroscopyCharacterise absorbance, transmittance, and reflectance, optical transitions, concentration, colour, or band gap, and…→In-situ Electrochemical pH MeasurementCharacterise local or bulk pH versus time, pH gradients near an electrode, and correlation with electrochemical response using a…→In-situ Tomographic SpectroscopyCharacterise internal geometry and density contrast, pores, cracks, inclusions, interfaces, and connectivity, and three-dimensional…→Synchrotron Infrared Microspectroscopy (SR-FTIR)Characterise micro-area molecular vibrations, chemical heterogeneity and phase distribution, and changes under controlled…→Total Scattering and Pair Distribution Function Analysis (PDF)Characterise local atomic pair distances, short- and medium-range order, and phase fraction, disorder, and nanoscale structural…→X-ray Absorption Fine Structure Spectroscopy (XAFS/XANES/EXAFS)Characterise oxidation state and electronic structure, coordination number and neighbour identity, and bond distances and local…→
Material Analysis
Composition & Elemental
Angle-Resolved Photoelectron Spectroscopy (ARPES)Characterise surface elemental composition and chemical state, valence-band or work-function information, and depth, angle, or…→Ash Content TestingCharacterise moisture, volatile matter, ash, and fixed-carbon fractions, mass change versus programmed temperature, and residual…→Atomic Absorption Spectroscopy (AAS)Characterise selected elemental concentrations, hydride-forming elements or mercury where configured, and single- or limited…→Atomic Fluorescence Spectroscopy (AFS)Characterise selected elemental concentrations, hydride-forming elements or mercury where configured, and single- or limited…→Auger Electron Spectroscopy (AES)Characterise surface elemental composition, micro-area contamination and segregation, and composition versus sputter depth using a…→Carbon and Sulfur Analysis (C/S)Characterise carbon, sulfur, oxygen, nitrogen, hydrogen, or halogen content, bulk elemental mass fraction, and trace-to-major…→Carbon Black Oil Absorption Number Testing (OAN)Characterise oil absorption number, aggregate structure and packing response, and batch-to-batch consistency using a scope agreed…→Coal Proximate and Quality Analysis (Proximate analysis)Characterise moisture, volatile matter, ash, and fixed-carbon fractions, mass change versus programmed temperature, and residual…→Coulometric Sulfur AnalysisCharacterise carbon, sulfur, oxygen, nitrogen, hydrogen, or halogen content, bulk elemental mass fraction, and trace-to-major…→Direct Mercury AnalysisCharacterise total mercury concentration, trace mercury in solids and liquids, and batch or spatial variation where subsamples are…→Electron Probe Microanalysis (EPMA)Characterise micro-area elemental composition, phase and inclusion chemistry, and element maps, traverses, and diffusion profiles…→Geochronology / Dating AnalysisCharacterise stable or radiogenic isotope ratios, isotopic composition and fractionation, and age or source information where a…→Glow Discharge Optical Emission / Mass Spectrometry (GD-OES/MS)Characterise bulk and depth-resolved elemental composition, coating thickness and layer transitions, and trace impurities in suitable…→Halogen AnalysisCharacterise carbon, sulfur, oxygen, nitrogen, hydrogen, or halogen content, bulk elemental mass fraction, and trace-to-major…→ICP-OES / ICP-MS Elemental Analysis (ICP-OES/MS)Characterise multi-element concentration, trace and ultra-trace impurities, and speciation, spatial distribution, isotope ratio, or…→Inverse Photoemission Spectroscopy (IPES)Characterise unoccupied electronic states, conduction-band onset and electron affinity, and changes in electronic structure with…→Ion Chromatography (including Combustion IC) (IC/CIC)Characterise inorganic anions and cations, organic acids or target ionic species, and total halogens or sulfur after combustion IC…→Ion-Selective Electrode Analysis (ISE)Characterise target ion activity or concentration, acid/base, redox, complexometric, or precipitation endpoint, and method-defined…→Karl Fischer Moisture Analysis (KF)Characterise water content, trace moisture or percent-level moisture, and water released by oven transfer where direct titration is…→Kjeldahl Nitrogen DeterminationCharacterise Kjeldahl nitrogen, crude protein after an agreed conversion factor, and method-defined organic plus ammonium nitrogen…→Laser Ablation ICP-MS (LA-ICP-MS)Characterise multi-element concentration, trace and ultra-trace impurities, and speciation, spatial distribution, isotope ratio, or…→Liquid Chromatography-Atomic Fluorescence Spectroscopy (LC-AFS)Characterise selected elemental concentrations, hydride-forming elements or mercury where configured, and single- or limited…→Liquid Chromatography-ICP-MS (LC-ICP-MS)Characterise multi-element concentration, trace and ultra-trace impurities, and speciation, spatial distribution, isotope ratio, or…→Nano Secondary Ion Mass Spectrometry (Nano-SIMS)Characterise elemental and isotopic distribution, dopant or impurity depth profile, and nanoscale chemical heterogeneity using a…→Organic / Elemental Carbon Analysis (OC/EC)Characterise organic carbon, elemental carbon, and total carbon and method-defined fractions using a scope agreed around your sample…→Organic Elemental Analysis (EA)Characterise bulk CHNS or CHNS/O composition, empirical elemental ratios, and sample purity or batch consistency using a scope agreed…→Oxygen, Nitrogen and Hydrogen Analysis (ONH)Characterise carbon, sulfur, oxygen, nitrogen, hydrogen, or halogen content, bulk elemental mass fraction, and trace-to-major…→Rock-Eval Pyrolysis and Organic Matter TypingCharacterise S1, S2, S3 and Tmax, total organic carbon and production index, and kerogen type and maturity indicators using a scope…→Single-Particle ICP-MS (spICP-MS)Characterise multi-element concentration, trace and ultra-trace impurities, and speciation, spatial distribution, isotope ratio, or…→Spark Optical Emission Spectroscopy (Spark-OES)Characterise major, minor, and trace alloying elements, grade identification, and composition uniformity across locations using a…→Stable Isotope Ratio Analysis (IRMS)Characterise stable or radiogenic isotope ratios, isotopic composition and fractionation, and age or source information where a…→Titrimetric Analysis (including Potentiometric Titration)Characterise target ion activity or concentration, acid/base, redox, complexometric, or precipitation endpoint, and method-defined…→Total Organic Carbon Analysis (TOC)Characterise total carbon, inorganic carbon, and total organic carbon, dissolved or non-purgeable organic carbon, and bulk…→Ultraviolet Photoelectron Spectroscopy (UPS)Characterise surface elemental composition and chemical state, valence-band or work-function information, and depth, angle, or…→Wet Chemical AnalysisCharacterise target ion activity or concentration, acid/base, redox, complexometric, or precipitation endpoint, and method-defined…→X-ray Fluorescence Spectroscopy (XRF)Characterise major and minor elements, selected trace elements, and bulk composition or spatial screening where configured using a…→X-ray Photoelectron Spectroscopy (XPS)Characterise surface elemental composition and chemical state, valence-band or work-function information, and depth, angle, or…→
Material Analysis
Chromatography & Diagnostics
Capillary Electrophoresis (CE)Characterise migration time and peak area, ionic or chiral purity, and target concentration or molecular-size/charge distribution…→Comprehensive Two-Dimensional GC-MS (GCxGC-MS)Characterise two-dimensional retention coordinates, volatile and semi-volatile composition, and co-eluting trace components and class…→Dynamic Secondary Ion Mass Spectrometry (D-SIMS)Characterise elemental and isotopic distribution, dopant or impurity depth profile, and nanoscale chemical heterogeneity using a…→Enantiomeric Excess Analysis (Chiral ee)Characterise enantiomeric ratio, enantiomeric excess, and chiral purity and minor-enantiomer content using a scope agreed around your…→FIB-TOF-SIMS / Time-of-Flight SIMS AnalysisCharacterise buried interfaces and layer thickness, site-specific defects, pores, and microstructure, and three-dimensional or…→Fourier Transform Ion Cyclotron Resonance Mass Spectrometry (FT-ICR-MS)Characterise exact mass and isotopic pattern, molecular formula and heteroatom class, and complex-mixture composition and…→Gas Chromatography (GC)Characterise volatile and semi-volatile composition, retention time and mass spectrum, and target concentration or evolved-product…→Gas Chromatography-Mass Spectrometry (GC-MS)Characterise volatile and semi-volatile composition, retention time and mass spectrum, and target concentration or evolved-product…→Gel Permeation / Size Exclusion Chromatography (GPC/SEC)Characterise inorganic anions and cations, organic acids or target ionic species, and total halogens or sulfur after combustion IC…→General / High-Resolution Mass Spectrometry (MS/HRMS)Characterise accurate mass and isotope pattern, retention time and fragment spectrum, and target concentration or untargeted…→High-Performance Liquid Chromatography (HPLC)Characterise retention time and peak area, purity and component profile, and target concentration with calibration using a scope…→Liquid Chromatography-Mass Spectrometry (LC-MS)Characterise accurate mass and isotope pattern, retention time and fragment spectrum, and target concentration or untargeted…→MALDI Time-of-Flight Mass Spectrometry (MALDI-TOF-MS)Characterise molecular mass and mass distribution, peptide/protein, polymer, lipid, or biomolecule fingerprint, and spatial molecular…→Pyrolysis / Thermal-Desorption GC-MS (Py/TD-GC-MS)Characterise volatile and semi-volatile composition, retention time and mass spectrum, and target concentration or evolved-product…→Rod Thin-Layer Chromatography with Flame-Ionisation Detection (TLC-FID)Characterise retention factor and component profile, class fraction or purity, and semi-quantitative or calibrated component amount…→Temperature-Programmed Thermal Desorption Mass Spectrometry (TDS-MS)Characterise volatile and semi-volatile composition, retention time and mass spectrum, and target concentration or evolved-product…→Thermal Analysis Evolved-Gas Analysis (TG-FTIR/MS/GC-MS) (EGA)Characterise mass change and thermal-event temperature, evolved-gas identity and relative intensity, and decomposition, desorption,…→Thin Layer Chromatography (TLC)Characterise retention factor and component profile, class fraction or purity, and semi-quantitative or calibrated component amount…→Failure AnalysisUse Failure Analysis to evaluate multi-method evidence needed to identify failure causes, unknown materials, deposits, or…→Microplastic Identification and Analysis (Microplastics)Use Microplastic Identification and Analysis (Microplastics) to evaluate multi-method evidence needed to identify failure causes,…→Scale Deposit AnalysisUse Scale Deposit Analysis to evaluate multi-method evidence needed to identify failure causes, unknown materials, deposits, or…→Unknown Material and Formulation AnalysisUse Unknown Material and Formulation Analysis to evaluate multi-method evidence needed to identify failure causes, unknown materials,…→
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