Particles and nanostructure
Compare particle size, shape, dispersion, agglomeration and internal contrast at nanometre scale.
Material Analysis · Microscopy & Imaging
Transmission / Scanning Transmission Electron Microscopy (TEM/STEM)
See internal nanoscale structure, particle morphology, lattice features, defects and interfaces in electron-transparent specimens, with optional diffraction and local chemical analysis.
- Price
- from£90 per sample, excl. VAT
- Turnaround
- 6 working days Preparation and scope dependent
- Available platforms
- Thermo Fisher Spectra UltraJEOL JEM-2100F
- Typical outputs
- TEM and STEM imagesHRTEM lattice imagesSAED diffraction patternsOptional EDS or EELS results Scope and file package agreed before acquisition
Why this test
Resolve internal structure beyond the reach of conventional SEM
TEM transmits electrons through an ultra-thin region; STEM scans a focused probe across it. Together they connect nanoscale morphology, crystallography and local chemistry to the same feature.
Lattice and crystallinity
Use HRTEM, FFT or lattice-spacing measurements and SAED to investigate local crystal information.
Defects and interfaces
Examine grain boundaries, dislocations, stacking faults, coatings, multilayers and buried interfaces.
Local chemistry
Add STEM-EDS or EELS when elemental distribution or electronic and chemical information is central.
Preparation-led decisions
Choose grid preparation, ion milling, FIB lift-out or ultramicrotomy around the target region and material.
Choose the scope
Start with the structural question
The target feature, required spatial resolution, elements of interest and preparation route determine the most useful acquisition mode.
TEM morphology
Best for nanoparticle morphology, size, dispersion, agglomeration and internal contrast.
- Recommended mode
- Bright-field or dark-field TEM at agreed magnifications
- Common outputs
- Scale-bar images and agreed feature measurements
- Preparation note
- Powders or stable dispersions can often be deposited onto a suitable grid
HRTEM and diffraction
Best for lattice fringes, crystallinity, orientation and local phase evidence.
- Recommended mode
- HRTEM with FFT or lattice measurements; SAED where suitable
- Common outputs
- Lattice-resolved images, spacing evidence and diffraction patterns
- Preparation note
- A thin, clean and stable region aligned to the crystallographic question is essential
STEM and HAADF
Best for Z-contrast imaging, interfaces and scanning acquisition correlated with spectroscopy.
- Recommended mode
- STEM with HAADF or other available detectors
- Common outputs
- Detector images from agreed regions of interest
- Preparation note
- Thickness, drift, contamination and beam stability influence achievable contrast
EDS and EELS analysis
Best for local elemental distribution and selected electronic or chemical-state questions.
- Recommended mode
- STEM-EDS point, line or maps; EELS where configuration permits
- Common outputs
- Spectra, profiles, elemental maps or selected EELS data
- Preparation note
- State target elements or edges, expected concentration and required spatial resolution
Common outputs
A data package matched to the feature and decision
Fields of view, modes, measurements, file formats and raw-data availability are agreed before preparation and acquisition.
TEM / STEM image set supplied with the agreed units, labels, sample reference and measurement conditions.
Acquisition context supplied with the agreed units, labels, sample reference and measurement conditions.
HRTEM and lattice evidence supplied with the agreed units, labels, sample reference and measurement conditions.
SAED patterns supplied with the agreed units, labels, sample reference and measurement conditions.
EDS analysis supplied with the agreed units, labels, sample reference and measurement conditions.
EELS and native files supplied with the agreed units, labels, sample reference and measurement conditions.
Specialist modes: aberration-corrected TEM/STEM, in-situ holders, 4D-STEM, tomography, Lorentz TEM and cryogenic workflows require a separate feasibility and quotation review.
Illustrative examples
How different TEM and STEM outputs are presented
These simulated examples explain the output types only. Customer results depend on the specimen, preparation route and agreed acquisition conditions.
Overview and detail images can show particle size, shape, agglomeration and local contrast.
Illustrative simulated output, not customer data.
High-resolution images can support lattice-spacing and interface interpretation where specimen quality permits.
Illustrative simulated output, not customer data.
Selected-area diffraction can support phase, orientation and crystallinity assessment.
Illustrative simulated output, not customer data.
Correlated HAADF-STEM and EDS views can compare structure with local elemental distribution.
Illustrative simulated output, not customer data.Sample requirements
What to send and what must be prepared first
The target region must be electron-transparent, clean and stable enough for the requested imaging or spectroscopy mode.
| Sample type | Preferred submission | Preparation and information required |
|---|---|---|
| Powders and nanoparticles | Small representative quantity | State composition, expected size, dispersion solvent and whether carbon, copper or another grid material must be avoided. |
| Stable dispersions | Practical volume confirmed after review | Provide solvent, concentration, dispersant or surfactant and stability information. Confirm whether dilution is acceptable. |
| Thin films and membranes | Electron-transparent area or preparation stock | Mark plan-view or cross-section orientation and identify the target layer, interface or feature. |
| Bulk and cross-sections | Preparation stock sized to the agreed route | Usually require FIB lift-out, ion milling, twin-jet electropolishing or ultramicrotomy. Mark the exact target location. |
| Prepared grids or lamellae | Protected and clearly labelled | Identify grid or lamella, orientation, priority regions and previous preparation or coating steps. |
| Special-handling samples | Advance review required | Declare magnetic, volatile, vacuum-unstable, air/moisture-sensitive, beam-sensitive, toxic, biological or radioactive properties before shipment. |
Grid selection: tell us when carbon, copper, nickel, molybdenum or another support could interfere with the intended analysis.
Region of interest: include a marked image, drawing or coordinate reference for site-specific interfaces, coatings, defects or particles.
Questions and answers
Common TEM / STEM decisions
Short answers to the issues that most often change preparation, platform or interpretation.
What is the difference between TEM and STEM?
TEM forms an image from electrons transmitted through a thin specimen. STEM scans a focused probe and records signals point by point, which is especially useful for HAADF contrast and correlated elemental mapping.
Do I need FIB preparation?
Not always. Nanopowders and stable dispersions can often be deposited directly onto grids. Bulk materials, coatings, interfaces and site-specific cross-sections commonly need FIB or another thinning route.
Can TEM measure lattice spacing and identify phases?
HRTEM and diffraction can provide local lattice and crystallographic evidence. Reliable phase identification may also need calibration, indexing and complementary XRD or spectroscopy.
Can you provide EDS or EELS mapping?
Often, but feasibility depends on thickness, stability, element sensitivity, signal level, spatial resolution and the available detector configuration. State the target elements or edges before quotation.
How much sample should I send?
Only a small quantity may be consumed, but the practical amount depends on concentration, preparation route and repeat work. We confirm submission quantity after reviewing the sample.
What can prevent a successful TEM result?
Excess thickness, contamination, unstable dispersion, beam damage, charging, drift, strong magnetism, poor target definition and preparation artefacts can all limit the result.
Request a quote
Send the information needed to scope TEM / STEM correctly
- Material, sample form and number of samples
- Target particle, defect, layer, interface or region of interest
- Required TEM, HRTEM, SAED, STEM, EDS or EELS outputs
- Expected feature size, elements or energy-loss edges of interest
- Preparation status, file requirements and any sample hazards