Atomic Force Microscopy (AFM) Analysis equipment image for TESTDOG microscopy and imaging support

Material Testing · Microscopy & Imaging

Atomic Force Microscopy (AFM) Analysis

Instrument model
Bruker Dimension ICON
Oxford Instruments MFP-3D Infinity / Origin+
Shimadzu SPM-9700
Agilent 5500
Typical turnaround
3.5-8 working days
Common outputs
AFM height / topography imagesRa / Rq roughness valuesoptional phase, KPFM, PFM, C-AFM, QNM, MFM, EFM, force curve, or force mapping outputs
Price from
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Overview & applications

When to use AFM in an engineering investigation

AFM helps engineering and research teams investigate surface morphology, nanoscale height variation, and roughness, nanoflake thickness, step height, surface phase contrast, and local heterogeneity, surface potential, piezoresponse, conductivity, nanomechanical, magnetic, electrostatic, liquid-mode, force curve, or force mapping behaviour when specialist afm modes are selected with a lab-ready scope. TESTDOG can help translate an unclear request into the right imaging route, sample preparation notes and reporting requirements.

Use this page as a starting point for deciding whether AFM is suitable before requesting a quotation.

What this test can help you understand

Surface morphology, nanoscale height variation,

Assess surface morphology, nanoscale height variation, and roughness as part of a lab-ready investigation scope.

Nanoflake thickness, step height, surface

Assess nanoflake thickness, step height, surface phase contrast, and local heterogeneity as part of a lab-ready investigation scope.

Surface potential, piezoresponse, conductivity, nanomechanical,

Assess surface potential, piezoresponse, conductivity, nanomechanical, magnetic, electrostatic, liquid-mode, force curve, or force mapping behaviour when specialist AFM modes are selected as part of a lab-ready investigation scope.

Samples & requirements

Suitable samples and what to prepare

Typical sample types

  • Powders, liquids, bulk samples, and thin-film samples
  • Flat films, coatings, polymers, composites, 2D materials, and nanostructured surfaces
  • Powders or particles dispersed onto a suitable substrate
  • Samples for PFM, KPFM, C-AFM, MFM, QNM, force curve, or liquid-mode AFM where the platform and sample preparation are suitable

Submission requirements

  • Powder samples: provide about 20 mg
  • particle height/relief should normally be below 5 um for standard tests and below 1 um for special modes where required
  • Liquid samples: provide at least 1 mL where liquid-mode or liquid sample preparation is required
  • Powder/liquid samples: specify dispersion liquid, ultrasonic treatment time, and preparation concentration
  • Thin film or block samples: length and width should generally be 0.5-3 cm, thickness 0.1-1 cm, and surface roughness should not exceed about 5 um
  • mark the test surface clearly
  • Film thickness for some thin-film tests should generally be below about 15 um
  • samples for modulus mapping may need uniform preparation and sufficient thickness

Available options and related modes

AFM routes we can help coordinate

Standard morphology / topography AFM

Standard morphology / topography AFM can be scoped where the sample, objective and partner capability are suitable.

Surface roughness analysis

Surface roughness analysis can be scoped where the sample, objective and partner capability are suitable.

Phase imaging

Phase imaging can be scoped where the sample, objective and partner capability are suitable.

KPFM surface potential mapping

KPFM surface potential mapping can be scoped where the sample, objective and partner capability are suitable.

PFM piezoresponse testing

PFM piezoresponse testing can be scoped where the sample, objective and partner capability are suitable.

QNM / nanomechanical mapping

QNM / nanomechanical mapping can be scoped where the sample, objective and partner capability are suitable.

C-AFM / PeakForce TUNA conductivity-related

C-AFM / PeakForce TUNA conductivity-related modes can be scoped where the sample, objective and partner capability are suitable.

MFM magnetic imaging

MFM magnetic imaging can be scoped where the sample, objective and partner capability are suitable.

Deliverables

What you can expect back

01Height/topography images with scale information

Height/topography images with scale information.

02Raw data and processed result

Raw data and processed result figures where available.

03Ra/Rq roughness values, height profiles,

Ra/Rq roughness values, height profiles, and step-height measurements.

04Mode-specific maps such as phase,

Mode-specific maps such as phase, surface potential, piezoresponse, current, modulus, magnetic/electrostatic contrast, or force mapping outputs.

Final deliverables depend on sample condition, selected mode, instrument access and the agreed reporting scope.